Failure Analysis Engineer
hace 6 horas
Manchester
Overview Join Nexperia Manchester as a Failure Analysis Engineer to drive reliability for high-volume Power MOSFET devices. You will lead investigations across wafer and package levels, bridging Quality, Manufacturing, R&D and Customer Engineering to translate findings into robust, data-driven decisions. You’ll produce scientifically defensible reports, support 8D/RCA processes, and help grow a collaborative, capable lab culture. This role offers impact on product reliability and meaningful cross-functional collaboration in a global company. Pay / BenefitsCompetitive starting salaryAnnual Incentive Plan up to 6%Pension scheme up to 9%Hybrid and flexible workingEnhanced parental leaveEmployee assistance programme ResponsibilitiesCommunicate analytical methods, failure mechanisms, and conclusions across cross-functional teams and with customersPerform comprehensive FA on MOSFET devices using electrical characterization, microscopy and cross-sectional techniquesTranslate results into clear reports and visual analyses; present in cross-functional forumsIdentify systemic quality risks and contribute to preventive actions across design, process, and application guidanceSupport lab scope management, equipment upkeep and capability development; mentor junior colleaguesContribute to 8D, RCA activities and continuous improvement initiatives across the organisation Key requirementsBachelor’s or Master’s degree in Electrical Engineering, Materials Science, Physics, Microelectronics or related fieldCuriosity, structured problem-solving mindset and strong attention to detailExperience or strong academic exposure to semiconductor devices and failure analysisFamiliarity with device physics, manufacturing processes, and reliability mechanismsStrong scientific writing and presentation skillsAbility to communicate technical concepts clearly in cross-functional settingsStrong written and verbal communicationCollaborative and respectful communication styleMentoring and teamworkElectrical characterizationOptical microscopyX-ray